- Title
- Accuracy of LA-ICPMS zircon U-Pb age determination: an inter-laboratory comparison
- Creator
- Li, XianHua; Liu, XiaoMing; Liu, YongSheng; Su, Li; Sun, WeiDong; Huang, HuiQuing; Yi, Keewook
- Relation
- Science China: Earth Sciences Vol. 58, Issue 10, p. 1722-1730
- Publisher Link
- http://dx.doi.org/10.1007/s11430-015-5110-x
- Publisher
- Zhongguo Kexue Zazhishe
- Resource Type
- journal article
- Date
- 2015
- Description
- LA-ICPMS zircon U-Pb dating has been greatly advanced and widely applied in the past decade because it is a cheap and fast technique. The internal error of LA-ICPMS zircon U-Pb dating can be better than 1%, but reproducibility (accuracy) is relatively poor. In in order to quantitatively assess the accuracy of this technique, zircons from two dioritic rocks, a Mesozoic dioritic microgranular enclave (FS06) and a Neoproterozoic diorite (WC09-32), were dated independently in eight laboratories using SIMS and LA-ICPMS. Results of three SIMS analyses on FS06 and WC09-2 are indistinguishable within error and give a best estimate of the crystallization age of 132.2 and 760.5 Ma (reproducibility is ~1%, 2RSD), respectively. Zircon U-Pb ages determined by LA-ICPMS in six laboratories vary from 128.3±1.0 to 135.0±0.9 Ma (2SE) for FS06 and from 742.9±3.1 to 777.8±4.7 Ma (2SE) for WC09-32, suggesting a reproducibility of ~4% (2RSD). Uncertainty produced during LA-ICPMS zircon U-Pb analyses comes from multiple sources, including uncertainty in the isotopic ratio measurements, uncertainty in the fractionation factor calculation using an external standard, uncertainty in the age determination as a result of common lead correction, age uncertainty of the external standards and uncertainty in the data reduction. Result of our study suggests that the uncertainty of LA-ICPMS zircon U-Pb dating is approximately 4% (2RSD). The uncertainty in age determination must be considered in order to interpret LA-ICPMS zircon U-Pb data rationally.
- Subject
- zircon U-Pb dating; laser ablation-inducitvely coupled mass spectrometry; secondary ion mass spectrometry; accuracy; precision
- Identifier
- http://hdl.handle.net/1959.13/1323860
- Identifier
- uon:24910
- Identifier
- ISSN:1674-7313
- Language
- eng
- Reviewed
- Hits: 4630
- Visitors: 4583
- Downloads: 0
| Thumbnail | File | Description | Size | Format |
|---|